02193nam a2200517 c 4500001001300000005001500013007000300028008004100031020003400072041001300106049002800119052001600147056001300163082001700176240006500193245020000258246004000458260004500498300004700543500014600590500001800736546004100754650004700795650004700842700004600889700004400935700002400979700002001003700005601023700005601079700005601135700004401191700005601235700005601291880003701347880004401384880003001428880003101458880002801489880002701517880002701544880002401571900003301595900003601628950001101664KMO20222708720220713110148ta220527s2022    ulkad         001   kor    a9788964214374g93560:c\450001 akorheng0 lEM8267102lEM8267103c201a569.3b22-9  a569.32601a621.381522300aMicroelectronic circuits.s8th ed..l한국어0KAT202202681006880-01a마이크로전자회로 /d저자: Adel S. Sedra,eKenneth C. Smith,eTony Chan Carusone,eVincent Gaudet ;e역자: 정원섭,e김현철,e김호성,e도규봉,e유상대,e이한호19aMicroelectronic circuitsg(8th ed.)  6880-02a서울 :b한티미디어,c2022  axxviii, 1267 p. :b삽화, 도표 ;c26 cm  a권말부록: Standard resistance values and unit prefixes ; Typical parameter values for IC devices fabricated in CMOS and bipolar processes  a색인 수록  a영어 원작을 한국어로 번역 8a전자 회로[電子回路]0KSH1998008272 8a전기 공학[電氣工學]0KSH19980397921 aSedra, Adel S.,d1943-0KAC1996364574aut1 aSmith, Kenneth C.,d1932-0KAC2005080641 aCarusone, Tony Chan1 aGaudet, Vincent1 6880-03a정원섭,g鄭元燮,d1955-0KAC2013083441 6880-04a김현철,g金鉉哲,d1967-0KAC2014001691 6880-05a김호성,g金鎬成,d1957-0KAC2015143321 6880-06a도규봉,d1961-0KAC2016358851 6880-07a유상대,g劉尚大,d1958-0KAC2015187231 6880-08a이한호,g李漢鎬,d1967-0KAC201706264006245-01/(BaMaikeuro jeonja hoero  6260-02/(BaSeoul :bHanti Midieo,c20221 6700-03/(BaJeong, Wonseop1 6700-04/(BaGim, Hyeoncheol1 6700-05/(BaGim, Hoseong1 6700-06/(BaDo, Gyubong1 6700-07/(BaYu, Sangdae1 6700-08/(BaI, Hanho10a세드라, 아델 S.,d1943-10a스미스, 케네스 C.,d1932-0 b\45000