00925nam a2200217 k 4500001001500000005001500015008004100030040001900071049003000090052002000120056001400140082001700154100004400171245018200215260007100397300003400468502007300502653010100575900001400676963001700690KDM199635307  20180914093109970213s1996    tjka       CB 000   eng    a011001c0110010 lWM219227lWM219228c2fDP02a001.6424bC539t  a028.64230 a001.64242191 aChin, Byoung-moon.d1953-0KAC2018F512710aTest sequence generation from specification in system description language=x시스템 기술 언어로 된 규격으로 부터의 시험 계열 생성 기법/dByoung-Moon Chin  a대전:bKorea Advanced Institute of Science and Technology,c1996  aiv, 109 leaves:bill.;c26 cm0 a학위논문(박사) --b한국과학기술원:c전산학과,d1996  aTESTaSEQUENCEaGENERATIONaSPECIFICATIONaSYSTEMaDESCRIPTIONaLANGUAGEa기술a언어a규격10a진병문  a전산학과