00804nam a2200217 k 4500001001500000005001500015008004100030040001900071041001300090049003200103052002100135056001300156082001800169100004800187245014400235260003600379300003000415502008000445653004100525963002000566KDM199624655  20200811161008960920s1996    gnka       VB 000   kor    a011001c0110010 akorbeng0 lEM1432986lEM1432987c2fDP01a569.8b김125ㅅ  a569.8230 a621.381732191 a김강철,g金强哲,d1958-0KAC20170134110aCMOS VLSI의 신뢰도 향상을 위한 IDDQ 테스팅에 관한 연구=x(A)study on IDDQ testing for highly reiable CMOS VLSI/d金强哲  a진주:b慶尙大學校,c1996  aix,116장:b삽도;c26cm1 a학위논문(박사) --b경상대학교 대학원:c전자공학과,d1996  aCMOSaVLSIaIDDQ테스팅a신뢰도  a전자공학과