00856nam a2200205 a 4500001001300000005001500013008004100028041001300069049001700082052002100099056001300120082001800133100004000151245018300191260004000374300004300414502013100457504003400588900002800622KDM20070360220200715091312070111s2006    ulkad      AK 000   eng  0 aengbkor0 lWM496548fDP02a621.38152bS556s  a569.4240 a621.381522211 a심병섭,g沈炳燮0KAC20208970311a(A)statistical method for reliability of tunneling oxide in the flash memory=xFlash 메모리의 터널링 산화막 신뢰성 예측을 위한 통계적 방법/dByung Sup Shim  aSeoul:bSeoul National Univ.,c2006  axvi, 130 leaves:bill., charts;c26 cm1 aThesis(Ph.D.) --bSeoul National Univ.,cSchool of Electrical Engineering and Computer Science, College of Engineering,d2006.  aBibliography: leaves 119-128.10aShim, Byoungsup,d1972-