01176nam a2200289 k 4500001001500000005001500015008004100030035002000071040001300091049002100104052002100125086002000146245012800166260015400294300002300448440002000471500006000491500005500551500001700606500002000623650003600643650003500679700001700714700002100731710006800752963006600820WMF000029391  20201126134346870316s1985    us       tb   001   eng    a(OCoLC)15320099  aGPOcGPO0 lAV0000085952fXA06aC 13.58b85-3029  aC 13.58:85-302900aMetrology for electromagnetic technology:ba bibliography of NBS publications/dedited by Kathryn E. Kline, Mary E. DeWeese  aBoulder, Colo.:bU.S. Dept. of Commerce, National Bureau of Standards;a[Springfield, VA.:bOrder from National Technical Information Service],c1985  aiii, 68 p.;c28 cm00aNBSIR;v85-3029  aUpdates and supersedes NBSIR 82-1677 and NBSIR 84-3014.  aDistributed to depository libraries in microfiche.  a"July 1985."  aIncludes index. 0aElectromagnetismxBibliography. 0aCryoelectronicsxBibliography.1 aKline, K. E.1 aDeWeese, Mary E.  aUnited States.bNational Bureau of Standards0KAB2020105474aut  aElectromagnetismaCryoelectronicsaBibliographyaBibliography