01601nam a2200409 c 4500001001300000005001500013007000300028008004100031020003400072041001300106049002800119052001800147056001500165082001500180245018100195246006500376260004200441300003000483500005800513504002900571546004100600650006000641650006000701700004800761700004500809700005600854740004400910880004100954880002700995900002701022900002701049900002801076900002401104900002801128900002401156950001101180KMO20171739020170703170419ta170417s2014    ulkd          000   kor    a9788958918615g93180:c\200001 akorheng0 lEM6675516lEM6675517c201a370.183b17-3  a370.1832601a371.2622300aKABC-II =xKaufman assessment battery for korean children second edition :b전문가 지침서 /d저자: Alan S. Kaufman,eNadeen L. Kaufman ;e한국판 표준화: 문수백19aKABC-II = Kaufman assessment battery for childreng(2nd ed.)  6880-01a서울 :b인싸이트,c2014  a224 p. :b도표 ;c26 cm  a권말부록: 지연회생 표준점수 환산표 등  a참고문헌: p. 200-210  a영어 원작을 한국어로 번역 8a교육 측정 검사[敎育測定檢査]0KSH2002036204 8a심리 측정 검사[心理測定檢査]0KSH20020262441 aKaufman, Alan S.,d1944-0KAC2009067504aut1 aKaufman, Nadeen L.,d1945-0KAC2009067511 6880-02a문수백,g文壽伯,d1953-0KAC2012123640 aKaufman assessment battery for children  6260-01/(BaSeoul :bInssaiteu,c20141 6700-02/(BaMun, Subaek00a알랜 S. 카우프만00a나딘 L. 카우프만10a카우프만, 알랜 S.10a카우프만, A. S.10a카우프만, 나딘 L.10a카우프만, N. L.0 b\20000