00930nam a2200193 c 4500001001300000005001500013007000300028008004100031040001100072041001300083052003200096245014600128300002200274545006400296653016700360700005300527773013900580900001700719KSI00085053620110715110343ta110418s1998    ulk           000   kor    a0110010 akorbeng01a569.05b대483ㄱㄱc35(1)00a회로 분할에 의한 순차회로의 테스트생성 =xTest generation for sequential circuits based on circuit partitioning /d崔淏鎔  ap. 30-37 ;c26 cm  a최호용, 정회원, 충북대학교 전기전자공학부  a회로 분할a순차회로a적기계탐색법a고장검출률aCircuit partitioningaSequential circuitaIPMT methodaImplicit product machine traversal method1 a최호용,g崔淏鎔,d1957-0KAC2017039344aut0 t電子工學會論文誌. C.d大韓電子工學會.g제35권 4호(1998년 4월), p. 30-37q35:4<30w(011001)KSE199700887,x1226-585310aChoi, Hoyong