00964nam a2200229 a 4500001001300000005001500013007000300028008004100031041001300072049003100085052002200116056001500138082002000153100003600173245015400209260004600363300003400409502020200443504002800645546003400673900002700707KDM20140829820200716172844ta141113s2014    tjka     m MB 000   eng  0 aengbkor0 lWM780920lWM780921c2fWDP02a621.3815284b14-1  a569.4342501a621.38152842211 a권혁민,d1984-0KAC20162419611a(A) study on reliability and low frequency noise characteristics of CMOS and Si-based high-κ devices for analog and RF applications /dHyuk-min Kwon  aDaejeon :bChungnam National Univ.,c2014  axxiv, 255 p. :bill. ;c26 cm1 aThesis(Ph.D.) --bGraduate School, Chungnam National Univ.,cSemiconductors and Circuits/System, Dept. of Electronics, Radio Science & Engineering, and Information Communications Engineering,d2014  aIncludes bibliographies  aIn English; summary in Korean10aGwon, Hyeokmin,d1984-