01271nam a2200301 c 4500001001300000005001500013007000300028008004100031040001100072041001300083052002800096245019300124300002000317545006500337545006500402545006500467545007300532653007100605700004100676700001400717700003600731700001400767773011600781900001500897900002000912900001900932900001800951KSI00069332620081110130021ta080730s1991    ulk           000   kor    a0110010 akorbeng01a425.05b한446ㅎc1(1)00a회절무늬를 이용한 미세물체의 특성 측정 =xCharacterization of microscale objects based on the diffraction pattern analysis /d강기호,e전형욱,e손정영,e오명환  ap. 1-6 ;c29 cm  a강기호, 한국과학기술연구원 응용전자연구실  a전형욱, 한국과학기술연구원 응용전자연구실  a손정영, 한국과학기술연구원 응용전자연구실  a오명환, 한국과학기술연구원 응용물리·전자공학부  a회절무늬a미세물체aDiffraction patternaMicroscale object1 a강기호,d1961-0KAC2015079354aut1 a전형욱1 a손정영,d1950-0KAC2017485611 a오명환0 t한국광학회지.d한국광학회.g2권 1호(1991년 3월), p. 1-6q2:1<1w(011001)KSE199509129,x1225-628510aKang, Kiho10aJeon, Hyungwook10aSon, Jungyoung10aOh, Myunghwan