00961nam a2200217 c 4500001001300000005001500013008004100028040001100069041001300080052003000093245015100123300002200274545005300296545004300349653007200392700005300464700004800517773014100565900001900706900001800725KSI00039733520050601181207050526s2001    ggk           000   kor    a0110010 akorbeng01a530.9605b대469ㄷc6(2)00a전자부품의 고장분석 절차 및 방법=x(A)procedure and techniques of failure analyses for electronic components/d김명수,e천성일  ap. 99-108;c26 cm  a김명수, 수원대학교 산업정보공학과  a천성일, 전자부품연구원(KETI)  a전자부품a고장분석aFailure analysesaElectronic components1 a김명수,g金明洙,d1960-0KAC2017626614aut1 a천성일,g千聖日,d1967-0KAC2016346160 t大韓設備管理學會誌.d대한설비관리학회.g第6卷 2號(2001년 6월), p. 99-108q6:2<99w(011001)KSE200101408,x1598-247510aKim, Myung-Soo10aChan, Sung-Il