01233nam a2200289 c 4500001001300000005001500013008004100028040001100069041001300080052003000093245015200123300002200275545004300297545004300340545004300383545005300426653009700479700005300576700001400629700003600643700004800679773014100727900001800868900002000886900001800906900001900924KSI00039628320050601181201050525s1999    ggk           000   kor    a0110010 akorbeng01a530.9605b대469ㄷc4(3)00a후막 칩 저항기의 가속수명시험=xAccelerated life testing of a thick film chip resistor/d천성일,e송병석,e이관훈,e김명수  ap. 93-102;c26 cm  a천성일, 전자부품연구원(KETI)  a송병석, 전자부품연구원(KETI)  a이관훈, 전자부품연구원(KETI)  a김명수, 수원대학교 산업정보공학과  a후막 칩 저항기a가속수명시험aAccelerated life testingaThick film chip resistor1 a천성일,g千聖日,d1967-0KAC2016346164aut1 a송병석1 a이관훈,d1965-0KAC2017120961 a김명수,g金明洙,d1960-0KAC2017626610 t大韓設備管理學會誌.d대한설비관리학회.g第4卷 3號(1999년 9월), p. 93-102q4:3<93w(011001)KSE200101408,x1598-247510aChan, Sung-Il10aSong, Byeng-Suk10aLee, Kwan-Hun10aKim, Myung-Soo