00992nam a2200229 c 4500001001300000005001500013008004100028040001100069041001300080052001700093245016800110300003000278545005600308545006000364653009800424700004800522700001900570773012000589856001500709900002000724900001800744KSI00008646120040111175948031125s1983    tgka          000   kor    a0110010 akorbeng00a8505b618c400a조합논리회로에 있어서의 random testing의 확률적 해석=xProbabilistic analysis of random testing for combinational circuits/d禹鍾鎬,e安光善  ap. 29-32:b삽도;c26 cm  a우종호, 부산수산대학 전자통신공학과  a안광선, 경북대학교 공과대학 전자공학과  a조합논리회로aRandomaTestinga확률적 해석aProbabilisticaCombinationalaCircuits1 a안광선,g安光善,d1949-0KAC2017458431 a우종호4aut0 t電子技術硏究誌.d慶北大學校 出版部.g4권(1983년), p. 29-32q4<29w(011001)KSE199504020,x1225-214X40u3282946aK10aAhn, Gwang-Seon10aWoo, Chong-Ho