00980nam a2200217 c 4500001001300000005001500013008004100028040001100069041001300080052002800093245016900121300003200290545004700322545004700369653010300416700001900519700004800538773013900586900001800725900001900743KSI00015740220040212183907031215s1994    ulka          000   kor    a0110010 akorbeng01a569.05b대483c31(1.5)00a반도체 메모리의 테스트를 위한 MTA(Memory TestAble code)코드=xMTA(Memory TestAble) Code for Testing in Semiconductor Memories/d李仲鎬,e趙相福  ap. 111-121:b삽도;c26 cm  a이중호, 울산대학교 전자공학과  a조상복, 울산대학교 전자공학과  a반도체메모리a테스트aMTAaMemory Testable Codea코드aTestingaSemiconductoraMemories1 a이중호4aut1 a조상복,g趙相福,d1955-0KAC2013071700 t電子工學會論文誌. A.d大韓電子工學會.g31卷 8號(1994년 8월), p. 111-121q31:8<111w(011001)KSE199508730,x1016-135X10aLee, Joong Ho10aCho, Sang Bock