01579nam a2200337 c 4500001001300000005001500013008004100028040001100069041001300080052002600093245030700119300003200426545004000458545004000498545004000538545004000578545004000618653015600658700001900814700004800833700004800881700004800929700003600977773011301013856002001126900001901146900002101165900001801186900002101204900001601225KSI00013699020040117190145031209s2000    ulka          000   kor    a0110010 akorbeng01a433.05b한462c13(5)00a파장분산형 엑스선 분광기에 의한 전자탐침미세분석시 xe 표준물질에 관한 연구=x(A)study on the standards for xe analysis by wavelength dispersive x - ray spectrometer (wds) of electron probe micro analysis (epma)/d박순달,e하영경,e김종구,e지광용,e김원호  ap. 565-572:b삽도;c26 cm  a박순달, 한국원자력연구소  a하영경, 한국원자력연구소  a김종구, 한국원자력연구소  a지광용, 한국원자력연구소  a김원호, 한국원자력연구소  a파장분산형a엑스선a분광기a전자탐침미세분석시aXea표준물질aStandardsaWavelengthaDispersiveaSpectrometeraMicroaEPMAaWDS1 a박순달4aut1 a하영경,g河英慶,d1964-0KAC2017229951 a김종구,g金鍾九,d1954-0KAC2018464841 a지광용,g池光龍,d1954-0KAC2017021291 a김원호,d1952-0KAC2018J74510 t분석과학.d한국분석과학회.g13권 5호(2000년 10월), p. 565-572q13:5<565w(011001)KSE19950850440u3095898aKd00010aPark, Soon Dal10aHa, Young Kyeung10aKim, Jong Goo10aJee, Kwang Young10aKim, Won Ho