00958nam a2200217 c 4500001001300000005001500013008004100028040001100069052002600080245014200106300003100248545006200279545006200341653006800403700005300471700004800524773011100572856002000683900001800703900001900721KSI00013655820040211190107031209s1997    ulka          000   kor    a01100101a433.05b한462c10(4)00aTOF-SIMS를 이용한 표면분석=xSurface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS)/d이연희,e한승희  ap. 87-104:b삽도;c26 cm  a이연희, 한국과학기술연구원 특성분석센터  a한승희, 한국과학기술연구원 특성분석센터  aTOF-SIMSa표면분석aTime-of-flightaSecondaryaSpectrometry1 a이연희,g李姸姬,d1961-0KAC2017106554aut1 a한승희,g韓承熙,d1957-0KAC2017325970 t분석과학.d한국분석과학회.g10권 5호(1997년 10월), p. 87-104q10:5<87w(011001)KSE19950850440u3095406aKd00010aLee, Yeon Hee10aHan, Seung Hee