01780nam a2200373 c 4500001001300000005001500013008004100028040001100069041001300080052002500093245031400118300003200432545005900464545005900523545006200582545003700644545004100681545004100722653029100763700001901054700001401073700001401087700001401101700001401115700003601129773011001165856002001275900002001295900001701315900001901332900001701351900001901368900001901387KSI00013617720040211190034031209s1994    ulka          000   kor    a0110010 akorbeng01a433.05b한462c7(1)00aX-선 광전자 분광법 및 라더포드 후방산란법에 의한 개질된 고분자 시료의 표면분석=xSurface analysis of modified polymer samples by X-ray photoelectron spectroscopy and rutherford backscattering spectroscopy/d박성우,e김동환,e김영만,e박병선,e한완수,e서배석  ap. 301-313:b삽도;c26 cm  a박성우, 국립과학수사연구소 화학분석과  a김동환, 국립과학수사연구소 화학분석과  a김영만, 한국과학기술연구원 특성분석센터  a박병선, 전자통신연구소  a한완수, 목원대학교 화학과  a서배석, 카톨릭대학 화학과  aX-선a광전자a광전자분광법a분광법a라더포드a후방산란법a고분자시료a표면분석aPolymeraSamplesaX-rayaPhotoelectronaSpectroscopyaRutherfordaBackscatteringaX-ray photoelectron spectroscopy and rutherford backscattering spectroscopyaSurface analysis1 a박성우4aut1 a박병선1 a한완수1 a서배석1 a김영만1 a김동환,d1961-0KAC2018525500 t분석과학.d한국분석과학회.g7권 3호(1994년 9월), p. 301-313q7:3<301w(011001)KSE19950850440u3095125aKd00010aPark, Byung-Sun10aHan, Wan-Soo10aPark, Sung-Woo10aSuh, Bae-Suk10aKim, Young-Man10aKim, Dong-Hwan