00825nam a2200193 c 4500001001300000005001500013008004100028040001100069052002500080245013100105300003200236545004300268545004000311653009400351700001100445700004100456773011400497856002000611KSI00011958220040211180526031204s1989    ulka          000   kor    a01100101a433.05b한462c2(1)00a전자현미경을 통한 아결정립 전위구조 분석=xTEM analysis for subgrain boundary structure/d안성욱,e최주  ap. 440-440:b삽도;c26 cm  a안성욱, 한국과학기술연구원  a최주, 한국과학기술연구원  a전자현미경a아결정립a전위구조aTEMaAnalysisaSubgrainaBoundaryaStructure1 a최주1 a안성욱,d1955-0KAC2018445484aut0 t분석과학.d한국기기분석학회.g2권 2호(1989년 12월), p. 440-440q2:2<440w(011001)KSE19950850440u3094433aKd000