01003nam a2200181 c 4500001001300000005001500013008004100028040001100069052003200080245019600112300003200308545006200340653019000402700005300592773013900645856002000784900001700804KSI00002283220031119135841031017s2000    ulka          000   kor    a01100101a578.05b한433ㄱㅂc11(6)00a고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술=xTime-of-flight secondary Ion mass spectrometry(TOF-SIMS) for polymer surface analysis/d이연희  ap. 798-805:b삽도;c26 cm  a이연희, 한국과학기술연구원 특성분석센터  a고분자a표면분석a비행시간a이온a질량분석aTime-of-flightaSpectrometrytof-simsaTimeofflightaSecondaryaIonaMassaSpectrometryaPolymeraSurfaceaAnalysisaTOF-SIMS1 a이연희,g李姸姬,d1961-0KAC2017106554aut0 t고분자 과학과 기술.d韓國高分子學會.g11권 6호(2000년 12월), p. 798-805q11:6<798w(011001)KSE199508401,x1225-026040u3218529aKd00010aLee, Yeonhee